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ISO 22489:2006

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

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Microbeam analysis Electron probe microanalysis Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

Available format(s)

PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

15-03-2019

Superseded by

ISO 22489:2016

Language(s)

English, French

Published date

12-12-2006

€60.00
Excluding VAT

ISO 22489:2006 specifies requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using wavelength-dispersive spectrometers fitted either to an electron probe microanalyser or to a scanning electron microscope.

It describes the principle of the quantitative analysis, the general coverage of this technique in terms of elements, mass fractions and reference specimens, the general requirements for the instrument, and the fundamental procedures involved, such as specimen preparation, selection of experimental conditions, the measurements, the analysis of these and the report.

It is intended for the quantitative analysis of a flat and homogeneous bulk specimen using a normal incidence beam. It does not specify detailed requirements for either the instruments or the data reduction software. Operators should obtain information such as installation conditions, detailed procedures for operation and specification of the instrument from the makers of any products used.

DocumentType
Standard
Pages
14
PublisherName
International Organization for Standardization
Status
Withdrawn
SupersededBy

Standards Relationship
BS ISO 22489:2006 Identical

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