ISO 23830:2008
Current
The latest, up-to-date edition.
Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
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English, French
05-11-2008
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ISO 23830:2008 specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.
| DevelopmentNote |
Supersedes ISO/DIS 23830. (11/2008)
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| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
International Organization for Standardization
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| Status |
Current
|
| Standards | Relationship |
| NF ISO 23830 : 2009 | Identical |
| BS ISO 23830:2008 | Identical |
| JIS K 0153:2015 | Identical |
| 13/30261587 DC : 0 | BS ISO 17862 - SURFACE CHEMICAL ANALYSIS - SECONDARY ION MASS SPECTROMETRY - LINEARITY OF INTENSITY SCALE IN SINGLE ION COUNTING TIME-OF-FLIGHT MASS ANALYSERS |
| ASTM E 2695 : 2009 | Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy (Withdrawn 2018) |
| ISO 17862:2013 | Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers |
| BS ISO 13084:2011 | Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer |
| BS ISO 17862:2013 | Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers |
| 17/30356000 DC : 0 | BS ISO 13084 - SURFACE CHEMICAL ANALYSIS - SECONDARY-ION MASS SPECTROMETRY - CALIBRATION OF THE MASS SCALE FOR A TIME-OF-FLIGHT SECONDARY-ION MASS SPECTROMETER |
| ISO 13084:2011 | Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer |
| ISO 7873:1993 | Control charts for arithmetic average with warning limits |
| ISO 24236:2005 | Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale |
| ISO 7870-1:2014 | Control charts Part 1: General guidelines |
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