ISO 6342:2003
Current
Current
The latest, up-to-date edition.
Micrographics Aperture cards Method of measuring thickness of buildup area
Available format(s)
PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English
Published date
15-07-2003
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
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