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Micrographics Aperture cards Method of measuring thickness of buildup area
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Available format(s): PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users
Language(s): English
Published date: 15-07-2003
Publisher: International Organization for Standardization
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.
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