ISO 9220:2022
Current
The latest, up-to-date edition.
Metallic coatings Measurement of coating thickness Scanning electron microscope method
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
French, English
11-02-2022
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This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination of cross-sections with a scanning electron microscope (SEM). The method is applicable for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (see ISO1463). The lower thickness limit depends on the achieved measurement uncertainty (see Clause10).
NOTE The method can also be used for organic layers when they are neither damaged by the preparation of the cross-section nor by the electron beam during imaging.
| DocumentType |
Standard
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| Pages |
13
|
| PublisherName |
International Organization for Standardization
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| Status |
Current
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| Supersedes |
| Standards | Relationship |
| NF EN ISO 9220:2022 | Identical |
| PN-EN ISO 9220:2022-07 | Identical |
| EN ISO 9220:2022 | Identical |
| UNI EN ISO 9220:2022 | Identical |
| I.S. EN ISO 9220:2022 | Identical |
| UNE-EN ISO 9220:2022 | Identical |
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