• ISO/TS 17915:2013

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    Optics and photonics Measurement method of semiconductor lasers for sensing

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Withdrawn date:  12-04-2019

    Language(s):  English

    Published date:  25-06-2013

    Publisher:  International Organization for Standardization

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    Abstract - (Show below) - (Hide below)

    ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.

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    Development Note DRAFT ISO/DIS 17915 is also available for this standard. (02/2017)
    Document Type Technical Specification
    Publisher International Organization for Standardization
    Status Withdrawn
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
    IEC 60747-5-2:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
    ISO 13695:2004 Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers
    IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
    IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
    ISO 11145:2016 Optics and photonics Lasers and laser-related equipment Vocabulary and symbols
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