ISO/TS 18507:2015
Current
The latest, up-to-date edition.
Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
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English
22-07-2015
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ISO/TS 18507:2015 provides a framework on the uses of Total Reflection X-Ray Fluorescence (TXRF) spectroscopy for elemental qualitative and quantitative analysis of biological and environmental samples. It is meant to help technicians, biologist, doctors, environmental scientists, and environmental engineers to understand the possible uses of TXRF for elemental analysis by providing the guidelines for the characterization of biological and environmental samples with TXRF spectroscopy.
Measurements can be made on equipment of various configurations, from laboratory instruments to synchrotron radiation beamlines or automated systems used in industry.
ISO/TS 18507:2015 provides guidelines for the characterization of biological and environmental samples with TXRF spectroscopy. It includes the following: (a) description of the relevant terms; (b) sample preparation; (c) experimental procedure; (d) discussions on data analysis and result interpretation; (e) uncertainty; (f) case studies; and (g) references.
| Committee |
ISO/TC 201
|
| DocumentType |
Technical Specification
|
| Pages |
33
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| PD ISO/TS 18507:2015 | Identical |
| 17/30319520 DC : 0 | BS ISO 20289 - SURFACE CHEMICAL ANALYSIS - TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS OF WATER SAMPLES |
| ISO 20289:2018 | Surface chemical analysis — Total reflection X-ray fluorescence analysis of water |
| DIN 51003:2004-05 | Total reflection X-ray fluorescence analysis (TXRF) - Terminology and general principles |
| ISO 17331:2004 | Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy |
| ISO 14706:2014 | Surface chemical analysis Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy |
| ISO 18115:2001 | Surface chemical analysis Vocabulary |
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