ISO/TS 21432:2005
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Non-destructive testing Standard test method for determining residual stresses by neutron diffraction
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10-12-2019
28-07-2005
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ISO/TS 21432:2005 gives the standard test method for determining residual stresses in polycrystalline materials by neutron diffraction. It is applicable to homogeneous and inhomogeneous materials and to test pieces containing distinct phases.
| DevelopmentNote |
DRAFT ISO/DIS 21432 is also available for this standard. (03/2018)
|
| DocumentType |
Technical Specification
|
| Pages |
42
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| DD CEN ISO/TS 21432:2005 | Identical |
| I.S. CEN ISO TS 21432:2005 | Identical |
| DIN SPEC 1095;DIN ISO/TS 21432:2009-10 | Identical |
| XP CEN ISO/TS 21432 : 2008 XP | Identical |
| NBN CEN ISO/TS 21432 : 2005 | Identical |
| NEN NPR CEN ISO/TS 21432 : 2005 C1 2009 | Identical |
| DEFSTAN 03-21/5(2011) : 2011 | MECHANICAL METHODS FOR THE INDUCEMENT OF RESIDUAL SURFACE COMPRESSIVE STRESSES |
| ISO 5725-1:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
| ISO 3:1973 | Preferred numbers Series of preferred numbers |
| EN 13925-1:2003 | Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles |
| ISO 9001:2015 | Quality management systems — Requirements |
| EN 13925-2:2003 | Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures |
| EN 13925-3:2005 | Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments |
| EN 1330-11:2007 | Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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