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ISO/TS 25138:2019

Current

Current

The latest, up-to-date edition.

Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

06-08-2019

This document describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films.

This method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn, Zr and Al. Other elements that can be determined by the method are O, C, N, H, P and S.

Committee
ISO/TC 201/SC 8
DocumentType
Technical Specification
Pages
40
PublisherName
International Organization for Standardization
Status
Current
Supersedes

Standards Relationship
SIS-ISO/TS 25138:2019 Identical
PD ISO/TS 25138:2019 Identical

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