JEDEC JEP 148B : 2014
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
Hardcopy , PDF
English
12-07-2018
19-12-2022
| DocumentType |
Standard
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| Pages |
0
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| PublisherName |
JEDEC Solid State Technology Association
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| Status |
Superseded
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| SupersededBy |
The purpose of this procedure provides a consistent frame work for reliability qualification using the Physics-of-Failure (PoF) concept, which − is flexible with respect to the requirements of the intended application and market, − makes optimum use of the supplier’s advance quality planning and demonstration results gained during design and development and applicable knowledge based on design and technology similarities. Planning quality and reliability in advance and gaining reliability results with the progress of a design and development process is efficiently supported by a systematic procedure for risk and opportunityassessment.The qualification concept is based on customer - supplier partnership in order to achieve optimizedefforts.The methodology applies to the reliability qualification of semiconductor devices and theprocesses for their development and manufacturing.
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