JEDEC JEP 163:2015
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-09-2015
Publisher
Superseded date
17-01-2023
Superseded by
Free
Excluding VAT
This publication is intended as a guideline to develop and establish conditions for burn-in and life test of MIL-PRF-38535 QML integrated circuits.
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy |
| DSCC21204A:2025 | MICROCIRCUIT, PROCESSOR, DIGITAL, CMOS, RADIATION HARDENED, QUAD CORE LEON4 SPARC V8 PROCESSOR, MONOLITHIC SILICON |
| DSCC 25205:2025 | MICROCIRCUIT, DIGITAL CMOS, RADIATION HARDENED, 2.5 V QUAD LVDS DRIVER, MONOLITHIC SILICON |
| DSCC 14227B:2023 | MICROCIRCUIT, DIGITAL-LINEAR, 14 BIT, 125 MSPS ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON |
| DSCC 21204:2022 | MICROCIRCUIT, PROCESSOR, DIGITAL, CMOS, RADIATION HARDENED, QUAD CORE LEON4 SPARC V8 PROCESSOR, MONOLITHIC SILICON |
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