JEDEC JEP122H:2016
Current
Current
The latest, up-to-date edition.
FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-09-2016
Publisher
€242.63
Excluding VAT
This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions.
| DocumentType |
Standard
|
| Pages |
114
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
| CEI EN IEC 63287-2:2023 | Semiconductor devices - Guidelines for reliability qualification plans Part 2: Concept of mission profile |
| JEDEC JESD218B.03:2024 | Solid-State Drive (SSD) Requirements and Endurance Test Method |
| JEDEC JESD85A:2021 | METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS |
| JEDEC JESD93A:2022 | MULTICHIP MODULES (MCM) |
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