Name: JEDEC JESD 57A:2017
Brand: JEDEC

TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION:

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-11-2017

Publisher

JEDEC Solid State Technology Association

This test method defines the requirements and procedures for single-event effects (SEE) testing of analog and/or digital discrete semiconductor devices and integrated circuits by irradiation with energetic heavy ions.

DocumentType	Test Method
Pages	56
PublisherName	JEDEC Solid State Technology Association
Status	Current
Supersedes	JEDEC JESD 57:1996(R2003)

DSCC V62/22614:2022	MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT ANALOG MONITORING AND CONTROL SOLUTION WITH MULTICHANNEL ADC, DACs. AND TEMPERATURE SENSORS, MONOLITHIC SILICON
DSCC V62/18621:2022	MICROCIRCUIT, DIGITAL, MICROCONTROLLER,MONOLITHIC SILICON

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JEDEC JESD 57A:2017

TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION:

Abstract

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Standards Referenced By This Book

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