JEDEC JESD 78E:2016
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
IC LATCH-UP TEST
Available format(s)
Hardcopy , PDF
Superseded date
25-02-2022
Superseded by
Language(s)
English
Published date
23-11-2018
Publisher
This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits.
| Committee |
JC-14.1
|
| DocumentType |
Revision
|
| Pages |
0
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DSCC 16208H:2024 | MICROCIRCUIT, MEMORY, DIGITAL, CMOS, LOW POWER REPROGRAMMABLE 151,824 LOGIC ELEMENT FLASH FIELD PROGRAMMABLE GATE ARRAY WITH DECOUPLING CAPACITORS,MONOLITHIC SILICON |
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