JEDEC JESD17:1988
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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LATCH-UP IN CMOS INTEGRATED CIRCUITS
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-08-1988
Publisher
Superseded date
13-06-2018
Superseded by
Free
Excluding VAT
To define a standard measurement procedure for the characterization of CMOS integrated circuit latch-up susceptibility/immunity, measured under static conditions.
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy |
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