JEDEC JESD22-A117E:2018(R2024)
Current
Current
The latest, up-to-date edition.
Electrically Erasable Programmable ROM (EEPROM) Program / Erase Endurance and Data Retention Stress Test
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-10-2024
Publisher
Free
Excluding VAT
This standard specifies the procedural requirements for performing valid endurance, retention and crosstemperature tests based on a qualification specification.
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
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