JEDEC JESD22-B108B : 2010
Current
Current
The latest, up-to-date edition.
COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-09-2010
Publisher
Free
Excluding VAT
The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity at room temperature for surface-mount semiconductor devices.
| Committee |
JC-14.1
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| JEDEC JEP180:2020 | GUIDELINE FOR SWITCHING RELIABILITY EVALUATION PROCEDURES FOR GALLIUM NITRIDE POWER CONVERSION DEVICES |
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