JEDEC JESD61A.01:2007
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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ISOTHERMAL ELECTROMIGRATION TEST PROCEDURE
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-10-2007
Publisher
Superseded date
05-04-2025
Superseded by
Free
Excluding VAT
This document describes a procedure for conducting the ISOthermal accelerated wafer level electromigration Test (ISOT) [1], [2], [3], [4] using computer-controlled instrumentation.
| DocumentType |
Standard
|
| Pages |
48
|
| ProductNote |
This standard also refers to JEDEC JESD33B,JEDEC JESD202
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy |
| JEDEC JEP150A:2023 | Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface-Mount Devices |
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