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JEDEC JESD61A.01:2007

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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ISOTHERMAL ELECTROMIGRATION TEST PROCEDURE

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-10-2007

Superseded date

05-04-2025

Free

This document describes a procedure for conducting the ISOthermal accelerated wafer level electromigration Test (ISOT) [1], [2], [3], [4] using computer-controlled instrumentation.

DocumentType
Standard
Pages
48
ProductNote
This standard also refers to JEDEC JESD33B,JEDEC JESD202
PublisherName
JEDEC Solid State Technology Association
Status
Superseded
SupersededBy

JEDEC JEP150A:2023 Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface-Mount Devices

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