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JEDEC JESD78F.02:2023

Current

Current

The latest, up-to-date edition.

IC Latch-Up Test

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-11-2023

Free

This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress.

Committee
JC-14.1
DocumentType
Standard
Pages
94
PublisherName
JEDEC Solid State Technology Association
Status
Current
Supersedes

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