JEDEC JESD78F.02:2023
Current
Current
The latest, up-to-date edition.
IC Latch-Up Test
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-11-2023
Publisher
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress.
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