JEDEC JESD85A:2021
Current
Current
The latest, up-to-date edition.
METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-07-2021
Publisher
Free
Excluding VAT
The methods described in this document apply to failure modes and mechanisms whose failures exhibit a constant failure rate, e.g., an Arrhenius behavior characterized by an activation energy for failure.
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
| CEI EN IEC 63287-2:2023 | Semiconductor devices - Guidelines for reliability qualification plans Part 2: Concept of mission profile |
| CEI EN IEC 62506:2024 | Methods for product accelerated testing |
| JEDEC JESD 63:1998(R2023) | STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPERATURE |
| JEDEC JEP122H:2016 | FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES |
Summarise
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Important note : Users cannot be edited or removed once added to your Multi user PDF.