JEDEC JESD91B:2022
Current
Current
The latest, up-to-date edition.
Method for Developing Acceleration Models for Electronic Device Failure Mechanisms
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-03-2022
Publisher
Free
Excluding VAT
The method described in this document applies to all reliability mechanisms associated with electronic devices.
| DocumentType |
Revision
|
| Pages |
20
|
| ProductNote |
This standard also refers to JEDEC JESD85,JEP122,JESD47.
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Current
|
| Supersedes |
| JEDEC JESD93A:2022 | MULTICHIP MODULES (MCM) |
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