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JIS B 0671-3:2002

Current

Current

The latest, up-to-date edition.

Geometrical Product Specifications (GPS) - Surface texture: Profile method, Surfaces having stratified functional properties Part 3: Height characterization using the material probability curve

Available format(s)

Hardcopy , PDF

Language(s)

Japanese, English

Published date

20-03-2002

€91.47
Excluding VAT

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This part of JIS B 0671 establishes the evaluation process for determining parameters from the linear regions of the material probability curve, which is the Gaussian representation of the material ratio curve. The parameters are intended to aid in assessing tribological behaviour, for example of lubricated, sliding surfaces, and to control the manufacturing process.

DocumentType
Standard
Pages
0
PublisherName
Japanese Standards Association
Status
Current

Standards Relationship
ISO 13565-3:1998 Identical

Reaffirmed 2016

JIS B 0632:2001 Geometrical Product Specification (GPS) - Surface texture: Profile method - Metrological characteristics of phase correct filters
JIS B 0671-1:2002 Geometrical Product Specifications (GPS) -- Surface texture: Profile method; Surfaces having stratified functional properties -- Part 1: Filtering and general measurement conditions
JIS B 0671-2:2002 Geometrical Product Specifications (GPS) - Surface texture: Profile method, Surfaces having stratified functional properties Part 2: Height characterization using the linear material ratio curve
JIS B 0633:2001 Geometrical Product Specification (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture
JIS B 0651:2001 Geometrical Product Specification (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
JIS B 0631:2000 Geometrical Product Specification (GPS) - Surface texture: Profile method - Motif parameters

JIS B 0671-1:2002 Geometrical Product Specifications (GPS) -- Surface texture: Profile method; Surfaces having stratified functional properties -- Part 1: Filtering and general measurement conditions

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