JIS C 1010-2-31:1998

This Standard applies to handheld and hand-manipulated PROBE ASSEMBLES of the type described below, and related accessories, These PROBE ASSEMBLIES are for use in the interface between and electrical phenomenon and a measuring or test instrument. They may be stand-alone PROBE ASSEMBLES which are themselves within the scope of JIS C 1010-1, or accessories to other equipment within the scope of JIS C 1010-1. a) Low-voltage and high-voltage, non-attenuating PROBE ASSEMBLES (type A) Non-attenuating PROBE ASSEMBLES for direct connection to voltages not exceeding 63 kV r.m.s. or d.c. They do not incorporate active components, nor are they intended to provide a voltage divider function or a signal conditioning function, but they may contain passive non-attenuating components such as fuses. b) High-voltage attenuating or divider PROBE ASSEMBLES (type B) Attenuating or divider PROBE ASSEMBLES for direct connection to voltage exceeding 1 kV r.m.s. or d.c. but not exceeding 63 kV r.m.s. or d.c. The divider function may be carried out wholly within the PROBE ASSEMBLY, or party in the test or measuring equipment intended to be used with the PROBE ASSEMBLY. c) Low-voltage attenuating or divider PROBE ASSEMBLES (type C) Attenuating, divider or other signal conditioning PROBE ASSEMBLES for direct connection to voltages exceeding 30 V r.m.s. or 42.4 V peak or 60 V d.c., but not exceeding 1 kV r.m.s., peak or d.c. The signal conditioning function may be carried out wholly within the PROBE ASSEMBLY, or partly within the test or measuring equipment intended to be used with the PEOBW ASSEMBLY.

98 [20/07/1998]