JIS C 5003:1974
Current
The latest, up-to-date edition.
General test procedure of failure rate for electronic components
Hardcopy , PDF
English, Japanese
31-07-1974
Important note : Users cannot be edited or removed once added to your Multi user PDF.This Japanese Industrial Standard is applicable to electronic components, hereinafter referred to as the "components", to be produced continuously, under essentially the same design, and established quality control, on which a certain failure rate, during expected life time can generally be assumed; and specifies procedure for the initial judgement, maintenance, principle of expansion measuring interval, number of samples, test period, disposal of obtained results, etc. to determine failure rate level of the components in accordance with the single sampling inspection system by attributes.
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
Reaffirmed 2014 1974(R2014) [20/10/2014]1974(R2009) [01/10/2009]1974(R1993) [01/02/1993]1974 [01/07/1974]
| JIS C 5700:1974 | General rules for reliability assured electronic components |
| JIS C 5260:1996 | General rules of potentiometers for use in electronic equipment |
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