JIS C 5402-3-1:2005
Current
The latest, up-to-date edition.
Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance
Hardcopy , PDF
English, Japanese
20-03-2005
This section of JIS C 5402-3 is to define a standard test method to assess the insulation resistance of electromechanical components. This test may also be used for similar devices when specified in a detail specification.
DocumentType |
Test Method
|
Pages |
6
|
PublisherName |
Japanese Standards Association
|
Status |
Current
|
Standards | Relationship |
IEC 60512-3-1:2002 | Identical |
Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]
JIS C 5402-11-3:2005 | Connectors for electronic equipment - Tests and measurements Part 11-3: Climatic tests - Test 11c: Damp heat, steady state |
JIS C 5402-11-4:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-4: Climatic tests -- Test 11d: Rapid change of temperature Part 11-4: Climatic tests - Test 11d: Rapid change of temperature |
JIS C 5402-11-5:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-5: Climatic tests -- Test 11e: Mould growth Part 11-5: Climatic tests - Test 11e: Mould growth |
JIS C 5402-11-12:2005 | Connectors for electronic equipment - Tests and measurements Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic |
JIS C 5402-11-14:2006 | Connectors for electronic equipment - Tests and measurements Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test |
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