JIS C 60068-3-1:1995
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Background information, Section One - Cold and dry heat tests
Hardcopy , PDF
23-12-2016
English, Japanese
15-02-2008
The performance of components and equipments is influenced and limited by their internal temperatures which depend on the external ambient conditions and on the heat generated within the device itself. Whenever temperature gradients exist in the system formed by a device and its surroundings, a process of heat transfer will ensue. The tests cover cold and dry heat testing, with both sudden and gradual change of the temperature, and of non heat-dissipating and heat-dissipating specimens (the latter with or without artificial cooling). The use of test chambers with and without forced air circulation is covered as appropriate. A general block diagram of the total procedure is given in Appendix K.
| DocumentType |
Standard
|
| Pages |
35
|
| PublisherName |
Japanese Standards Association
|
| Status |
Superseded
|
| SupersededBy |
Reaffirmed 2011
| JIS C 60068-2-61:1996 | Environmental testing Part 2: Test methods Test Z/ABDM: Climatic sequence |
| JIS C 60068-2-40:1995 | Environmental testing Part 2: Tests, Test Z/AM: Combined cold/low air pressure tests |
| JIS C 5260-5:2000 | Potentiometers For Use In Electronic Equipment - Part 5: Sectional Specification: Single-turn Rotary Low-power Wirewound Potentiometers |
| JIS C 5260-2:2000 | Potentiometers For Use In Electronic Equipment - Part 2 - Sectional Specification: Lead-screw Actuated And Rotary Preset Potentiometers |
| JIS C 5260-4:2000 | Potentiometers For Use In Electronic Equipment - Part 4: Sectional Specification: Single-turn Rotary Power Potentiometers |
| JIS C 60068-3-7:2008 | Environmental Testing - Part 3-7: Supporting Documentation And Guidance - Measurements In Temperature Chambers For Tests A And B (with Load) |
| JIS C 60068-2-47:2008 | Environmental testing Part 2-47: Tests - Mounting of specimens for vibration, impact and similar dynamic tests |
| JIS C 5260-3:2000 | Potentiometers For Use In Electronic Equipment - Part 3 - Sectional Specification: Rotary Precision Potentiometers |
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