JIS C 7021:1977
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Environmental testing methods and endurance testing methods for discrete semiconductor devices
English
31-05-1977
20-06-1997
This Japanese Industrial Standard specifies the environmental testing methods and endurance testing methods to evaluate the stability of performance of discrete semiconductor devices (except integrated circuits) under several environmental conditions during the use, transport and storage.
| DocumentType |
Standard
|
| Pages |
74
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
77
| JIS C 5942:1997 | General rules of laser diodes used for recording and playback |
| JIS C 6112:1996 | General rules of transmitting and/or receiving modules for middle and high speed fiber optic transmission |
| JIS C 7032:1993 | General rules for transistors |
| JIS C 5941:1997 | Measuring methods of laser diodes for fiber optic transmission |
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