JIS K 0131:1996
Current
The latest, up-to-date edition.
General rules for X-ray diffractometric analysis
English
31-08-1996
This Japanese Industrial Standard specifies the general rules for the measurements of diffracted X-ray using a X-ray diffractometer in order to make the identification and determination, the accurate measurement of lattice constant, and the measurement of crystallinity degree, of substances.
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
Reaffirmed 2016
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