JIS K 0132:1997
Current
The latest, up-to-date edition.
General rules for scanning electron microscopy
Hardcopy , PDF
Japanese, English
01-10-1997
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This Japanese Industrial Standard specifies general matters which are needed when the morphological observation and analysis of micro spot on specimen surface are carried out mainly owing to the secondary electrons using a scanning electron microscope.
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
Reaffirmed 2016
| JIS K 0050:2005 | General rules for chemical analysis |
| JIS K 0215:2005 | Technical terms for analytical chemistry (analytical instrument part) |
| JIS H 7803:2005 | General rules for the determination of particle size and crystallite size in metal catalysts |
| JIS H 7804:2005 | Method for particle size determination in metal catalysts by electron microscope |
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