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JIS K 0199:2023

Current

Current

The latest, up-to-date edition.

Guideline for alignment procedure for identical location analysis between different microscopic measuring instruments

Published date

20-01-2023

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DocumentType
Standard
PublisherName
Japanese Standards Association
Status
Current

JIS K 0147-1:2017 Surface chemical analysis -- Vocabulary -- Part 1: General terms and terms used in spectroscopy
JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy

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