JIS R 1636:1998
Current
The latest, up-to-date edition.
Test method for thickness of fine ceramic thin films - Film thickness by contact probe profilometer
Hardcopy , PDF
Japanese, English
31-01-1998
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This Japanese Industrial Standard specifies the test method for thickness of fine ceramic thin films by a contact probe profilometer.
| DocumentType |
Test Method
|
| Pages |
0
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
Reaffirmed 2017
| JIS B 0651:2001 | Geometrical Product Specification (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments |
| JIS Z 8401:1999 | Guide to the rounding of numbers |
| JIS R 1600:1998 | Glossary Of Terms Relating To Fine Ceramics |
| JIS R 1637:1998 | Test method for resistivity of conductive fine ceramic thin films with a four-point probe array |
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