MIL-C-64030 Base Document:1986
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The latest, up-to-date edition.
CONTROL INDICATOR FOR DISPENSER AND MINES GROUND M131
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Important note : Users cannot be edited or removed once added to your Multi user PDF.Requirements and Quality Assurance criteria for fabrication of parts, assembly and packing of Control Indicator for Dispenser and Mines, M131.
| Committee |
FSC 1345
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| DevelopmentNote |
NOTICE 1 - Notice of Inactivation for New Design. NOTICE 2 - Notice of Validation but remains Inactive for New Design. (01/2014)
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| DocumentType |
Standard
|
| Pages |
110
|
| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Current
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| MIL M 64020D : 1989 | MICROCIRCUIT, AMPLIFIER, BIPOLAR, HIGH FREQUENCY, FRONT END |
| MIL-B-117G:1993 | BAG, SLEEVE AND TUBING |
| MIL-STD-129 Revision R:2014 | Military Marking for Shipment and Storage |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL S 19500/356 : D | SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR TYPES 1N4954 THROUGH 1N4996, 1N5968 AND 1N5969 JAN, JANTX, JANTXV AND JANS |
| MIL-R-39008-2 Revision F:1989 | RESISTORS FIXED, COMPOSITION (INSULATED) ESTABLISHED RELIABILITY STYLE RCR20 |
| MIL-STD-810 Revision G:2008 | ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS |
| MIL S 19500/445 : C | SEMICONDUCTOR DEVICE, DIODE, SILICON, SWITCHING TYPE 1N5712 JAN, JANTX, JANTXV, AND JANS |
| MIL R 39017/1 : N (3) | RESISTOR, FIXED, FILM (INSULATED) ESTABLISHED RELIABILITY RLR07 |
| MIL-P-14232 Revision E:1976 | PARTS, EQUIPMENT AND TOOLS FOR ARMY MATERIAL, PACKAGING OF |
| MIL-M-48646 Base Document:1986 | MICROCIRCUIT, DIGITAL, SCO/DLA MULTICHIP CMOS |
| MIL-F-18327 Revision F:2008 | FILTERS; HIGH PASS, LOW PASS, BAND PASS, BAND SUPPRESSION, AND DUAL FUNCTIONING, GENERAL SPECIFICATION FOR |
| MIL S 19500/427 : E | SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER TYPES 1N5614, 1N5616, 1N5618, 1N5620, 1N5622 JAN, JANTX, JANTXV, AND JANS |
| DOD STD 1686 : 0 | ELECTROSTATIC DISCHARGE CONTROL PROGRAM FOR PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES)(METRIC) |
| MIL C 39014/5 : E (4) | CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE) ESTABLISHED RELIABILITY, STYLES CLR11, CKR12, CKR14, CKR15 & CKR16. |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL S 19500/420 : D | SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER, RECTIFIER, GENERAL PURPOSE TYPES 1N5550 TO N5554 JAN, JANTX, JANTXV, AND JANS |
| MIL C 39001/5 : B | CAPACITOR, FIXED, MICA DIELECTRIC, ESTABLISHED RELIABILITY, STYLES CMR03 THRU CMR08 |
| MIL L 7961 : C | LIGHT, INDICATOR, PRESS TO TEST |
| MIL C 39014/2 : J | |
| MIL C 14409 : D | CAPACITOR, VARIABLE (PISTON TYPE, TUBULAR TRIMMER), GENERAL SPECIFICATION FOR |
| MIL S 19500/108 : E | SEMICONDUCTOR DEVICE, THYRISTORS (CONTROLLED RECTIFIERS), SILICON TYPES 2N682, 2N683, 2N685 THROUGH 2N692, 2N5206, TX2N682, TX2N683, TX2N685 THROUGH TX2N692 AND TX2N5206 |
| DOD HDBK 263 : LATEST | ELECTROSTATIC DISCHARGE CONTROL HANDBOOK FOR PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS, ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES)METRIC |
| MIL-R-39008-1 Revision F:1989 | RESISTORS FIXED, COMPOSITION (INSULATED) ESTABLISHED RELIABILITY STYLE RCR07 |
| MIL C 3098 : G | CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR |
| MIL S 19500/477 : B | SEMICONDUCTOR DEVICE, DIODE, SILICON, FAST RECOVERY, POWER RECTIFIER, TYPES 1N5802, IN5804, 1N5806, 1N5807, 1N5809 AND 1N5811, 1N5802US, 1N5804US, 1N5806US, 1N5809US, AND 1N5811US, JAN, JANTX, JANTXV, JANJ, JANS, JANHC, AND JANKC |
| MIL C 39003/1 : G | CAPACITOR, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE), TANTALUM, (POLARIZED, SINTERED SLUG), ESTABLISHED RELIABILITY, STYLE CSR 13 |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-A-48078 Revision A:1988 | AMMUNITION, STANDARD QUALITY ASSURANCE PROVISIONS, GENERAL SPECIFICATION FOR |
| MIL S 19500/117 : K | SEMICONDUCTOR DEVICES, DIODE, SILICON, VOLTAGE REGULATOR TYPES 1N962B THROUGH 1N992B, 1N962B-1 THROUGH 1N992B-1, JAN, JANTX, JANTXV AND JANS |
| MIL-S-46844 Revision C:1976 | SOLDER BATH SOLDERING OF PRINTED WIRING ASSEMBLIES |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
| MIL S 19500/255 : H (1) | SEMICONDUCTOR DEVICE, TRANSISTOR NPN, SILICON, SWITCHING, TYPES 2N2221A, 2N2222A, 2N2221AUA, 2N2222AUA, 2N2221AUB, AND 2N2222AUB, JAN, JANTX, JANTXV, JANTXVD, JANTXVH, JANTXVM, JANTXVR, JANS, JANSD, JANSH, JANSM, JANSR, JANHC, AND JANKC |
| MIL C 39014/22 : C | CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE) ESTABLISHED RELIABILITY, STYLE CKR22, CKR23 & CKR24 |
| MIL-STD-331 Revision D:2017 | FUZES, IGNITION SAFETY DEVICES AND OTHER RELATED COMPONENTS, ENVIRONMENTAL AND PERFORMANCE TESTS FOR |
| PPP-B-621 Revision D:1981 | BOXES, WOOD, NAILED AND LOCK CORNER |
| MIL-M-48647 Base Document:1986 | MICROCIRCUIT, DIGITAL, DECODER, LOGIC ARRAY |
| MIL-STD-105 Revision E:1989 | SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
| MIL-E-17555 Revision H:1984 | ELECTRONIC AND ELECTRICAL EQUIPMENT, ACCESSORIES, AND PROVISIONED ITEMS (REPAIR PARTS); PACKAGING OF |
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