MIL-E-63399 Revision B:1981
Current
Current
The latest, up-to-date edition.
ELECTRONICS-MCD ASSEMBLY FOR MINE, ANTITANK: HE, M75
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Publisher
Outlines quality controls for making inspection and packing of an electronic assembly used in the Mine, Anti tank: HE, M75.
| Committee |
FSC 1345
|
| DevelopmentNote |
B NOTICE 1 - Notice of Inactivation for New Design. B NOTICE 2 - Notice of Validation but remains Inactive for New Design. (12/2013)
|
| DocumentType |
Standard
|
| Pages |
151
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| MIL-B-117G:1993 | BAG, SLEEVE AND TUBING |
| MIL-STD-129 Revision R:2014 | Military Marking for Shipment and Storage |
| MIL-M-63320 Revision A:1981 | MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC) |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-R-39008 Revision C:1990 | RESISTOR, FIXED, COMPOSITION (INSULATED), ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| MIL-N-63396 Base Document:1981 | NETWORK, RESISTOR FIXED & ADJUSTABLE |
| MIL-A-63242 Revision A:1982 | AMPLIFIER, OPERATIONAL TRIPLE PROGRAMMABLE MICROPOWER |
| MIL-N-63400 Base Document:1981 | NETWORKS CAPACITOR-RESISTOR |
| MIL-P-14232 Revision E:1976 | PARTS, EQUIPMENT AND TOOLS FOR ARMY MATERIAL, PACKAGING OF |
| MIL-STD-275 Revision E:1984 | PRINTED WIRING - ELECTRONIC EQUIPMENT |
| MIL-P-63316 Base Document:1979 | PRIMER, BATTERY, ELECTRIC PARTS FOR AND LOADING, ASSEMBLING AND PACKING |
| MIL C 39014/5 : E (4) | CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE) ESTABLISHED RELIABILITY, STYLES CLR11, CKR12, CKR14, CKR15 & CKR16. |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| MIL S 19500/127 : M | SEMICONDUCTOR DEVICES, DIODE, SILICON, VOLTAGE REGULATOR TYPES 1N4370A THROUGH 1N4372A, 1N746A, THROUGH 1N759A, 1N4370A-1 THROUGH 1N4372A-1, 1N746A-1 THROUGH 1N759A-1, JAN, JANTX, JANTXV AND JANS |
| MIL S 19500/240 : F | SEMICONDUCTOR DEVICE, DIODE, SILICON, RECTIFIER TYPES 1N645-1, 1N647-1, 1N649-1, 1N-645UR-1, AND 1N649UR-1 JAN, JANTX AND JANTXV |
| MIL-R-39008-1 Revision F:1989 | RESISTORS FIXED, COMPOSITION (INSULATED) ESTABLISHED RELIABILITY STYLE RCR07 |
| MIL-P-63421 Base Document:1981 | POWER SUPPLY ASSEMBLIES FOR FASCAM ELECTRONIC ASSEMBLIES |
| MIL S 19500 : J | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-M-63321 Revision A:1981 | MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC) |
| MIL-A-48078 Revision A:1988 | AMMUNITION, STANDARD QUALITY ASSURANCE PROVISIONS, GENERAL SPECIFICATION FOR |
| MIL S 19500/291 : E | SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON, SWITCHING, TYPES N2N906A, 2N2907A, 2N2906AUA 2N2907AUA, 2N2906AUB, AND 2N2907AUB, JAN, JANTX, JANTXV, JANS, JANHC, JANKC |
| MIL-S-46844 Revision C:1976 | SOLDER BATH SOLDERING OF PRINTED WIRING ASSEMBLIES |
| MIL-STD-202 Revision H:2015 | ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
| MIL S 19500/255 : H (1) | SEMICONDUCTOR DEVICE, TRANSISTOR NPN, SILICON, SWITCHING, TYPES 2N2221A, 2N2222A, 2N2221AUA, 2N2222AUA, 2N2221AUB, AND 2N2222AUB, JAN, JANTX, JANTXV, JANTXVD, JANTXVH, JANTXVM, JANTXVR, JANS, JANSD, JANSH, JANSM, JANSR, JANHC, AND JANKC |
| MIL-STD-331 Revision D:2017 | FUZES, IGNITION SAFETY DEVICES AND OTHER RELATED COMPONENTS, ENVIRONMENTAL AND PERFORMANCE TESTS FOR |
| MIL P 55110 : LATEST | PRINTED WIRING BOARD, RIGID GENERAL SPECIFICATION FOR |
| MIL-STD-105 Revision E:1989 | SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
| MIL P 50884 : E | PRINTED WIRING BOARD, FLEXIBLE OR RIGID-FLEX, GENERAL SPECIFICATION FOR |
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