MIL-HDBK-1331 Revision A:2003
Current
The latest, up-to-date edition.
Parameters to be Controlled for the Specification of Microcircuits, Handbook for
22-10-2003
1. SCOPE
1.1 Scope
2. APPLICABLE DOCUMENTS
2.1 General
2.2 Government documents
2.3 Order of precedence
3. DEFINITIONS
4. GENERAL GUIDANCE
4.1 General
4.2 Requirements for standardized parameters
4.3 General items to be controlled
5. ELECTRICAL PARAMETERS TO BE CONTROLLED
6. NOTES
6.1 Intended use
6.2 Supersession information
6.3 Subject term (key word) listing
Gives the parameters required as a minimum for the specification of microcircuits. Parameters, rather than circuits, are considered because circuits vary with the manufacturers involved.
| DevelopmentNote |
Supersedes MIL STD 1331. (10/2003) A NOTICE 1 - Notice of Validation. (07/2011) A NOTICE 2 - Notice of Validation. (05/2016) NEW CHILD NOT 3 2021 IS NOW ADDED
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| DocumentType |
Standard
|
| Pages |
26
|
| ProductNote |
NEW CHILD NOT 3 2021 IS NOW ADDED
|
| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Current
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| Supersedes |
This handbook describes the parameters required as a minimum for the specification of microcircuits. Parameters, rather than circuits, are considered because circuits vary with the manufacturers involved. Further, circuit designs should be subject to change if improvement results as long as the affected designs are compatible and fully interchangeable. The specific objectives of this document are as follows: a. To provide the minimum parameters that should be specified to ensure adequate evaluation of circuit design and performance. b. To provide maximum commonality of parameters for purpose of test and measurement, within and between major classes of microcircuit types and to allow the recognition of interface problems between types of microcircuits. c. To provide standard abbreviations, definitions and symbols pertinent to the specification of microcircuits. d. To promote maximum interchangeability and compatibility between microcircuits types.
| MIL-M-38510-211 Base Document:1987 | Microcircuits, Digital, 32,768 Bit Schottky, Bipolar, Programmable Read-Only Memory (PROM), Monolithic Silicon |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-PRF-38534 Revision K:2017 | Hybrid Microcircuits, General Specification for |
| MIL-STD-883-1 Base Document:2019 | Environmental Test Methods for Microcircuits Part 1: Test Methods 1000-1999 |
| MIL-STD-883-1:2019+CHANGE 2:2024 | Environmental Test Methods for Microcircuits Part 1: Test Methods 1000-1999 |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
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