MIL-M-38510-211 Base Document:1987
Current
The latest, up-to-date edition.
MICROCIRCUITS, DIGITAL, 32,768 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON
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6. NOTES
Specifies the detail requirements for monolithic silicon, PROM microcircuits which employ thin film nichrome resistors (NiCr), titanium-tungsten (TiW), or zapped vertical emitter as the fusible link or programming element.
| Committee |
FSC 5962
|
| DevelopmentNote |
NOTICE 1 - Notice of Inactivation for New Design. NOTICE 2 - Notice of Validation but remains Inactive for New Design. (06/2001) New child NOT 3 2022 is added
|
| DocumentType |
Standard
|
| Pages |
75
|
| ProductNote |
New child NOT 3 2022 is added
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-HDBK-1331 Revision A:2003 | PARAMETERS TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | ELECTRONIC COMPONENT CASE OUTLINES |
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