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MIL-M-38510-23 Revision D:2003

MIL-M-38510-23 Revision D:2003

Current

Current

The latest, up-to-date edition.

Microcircuits, Digital, TTL, High Speed, Nand Gates Monolithic Silicon

Amended by

MIL-M-38510-23 Revision D Notice 3 - Validation:2023

Available format(s)

PDF

Published date

11-07-2003

Publisher

US Military Specs/Standards/Handbooks

1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES

Specifies silicon, monolithic, TTL, high speed, positive NAND logic gating microcircuits.

This specification covers the detail requirements for monolithic silicon, TTL, high speed, positive NAND logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.3)

DevelopmentNote
Inactive for new design. (07/2003) D NOTICE 1 - Notice of Validation but remains Inactive for New Design. (07/2008) D NOTICE 2 - Notice of Validation but remains Inactive for New Design. (04/2013) New child NOT 3 2023 is added
DocumentType
Standard
Pages
32
ProductNote
New child NOT 3 2023 is added
PublisherName
US Military Specs/Standards/Handbooks
Status
Current

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for
MIL-STD-1835 Revision D:2004 ELECTRONIC COMPONENT CASE OUTLINES

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PDF - English
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