MIL-M-38510-300 Revision E:2003
Current
Current
The latest, up-to-date edition.
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, NAND GATES, MONOLITHIC SILICON
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies monolithic silicon, low power Schottky, TTL, positive NAND logic gate microcircuits.
| Committee |
FSC 5962
|
| DevelopmentNote |
Inactive for new design. (01/2003) E NOTICE 1 - Notice of Validation but remains Inactive for New Design. (02/2008) E NOTICE 2 - Notice of Validation but remains Inactive for New Design. (11/2012)
|
| DocumentType |
Standard
|
| Pages |
36
|
| ProductNote |
New child NOT 3 2022 is added
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | ELECTRONIC COMPONENT CASE OUTLINES |
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