MIL-M-38510-384 Revision A:2004
Current
Current
The latest, up-to-date edition.
MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, AND, OR, NAND AND NOR GATES, MONOLITHIC SILICON
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Covers the detail requirements for monolithic silicon, advanced low power Schottky TTL, positive AND, OR, NAND, and NOR logic gating microcircuits.
| Committee |
FSC 5962
|
| DevelopmentNote |
Inactive for New Design. (11/2004) A NOTICE 1 - Notice of Validation but remains Inactive for New Design. (08/2009) A NOTICE 2 - Notice of Validation but remains Inactive for New Design. (06/2014)
|
| DocumentType |
Standard
|
| Pages |
44
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | ELECTRONIC COMPONENT CASE OUTLINES |
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