MIL-PRF-19500-116 Revision S:2012
Current
The latest, up-to-date edition.
Semiconductor Device, Silicon, Switching, Types 1N4148, 1N914, and 1N4531 Through Hole, Surface Mount and Unencapsulated Die, Quality Levels JAN, JANTX, JANTXV, JANHC, and JANKC
06-07-2012
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for switching diodes.
| DevelopmentNote |
Supersedes MIL S 19500/116 (J). (02/2000)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for silicon switching diodes. Three levels of product assurance (JAN, JANTX, and JANTXV) are provided for each encapsulated device type as specified in MIL-PRF-19500. Two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device type.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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