MIL-PRF-19500-157 Revision T:2009
Current
The latest, up-to-date edition.
Semiconductor Device, Diode, Silicon, Voltage-Reference Temperature Compensated, Types 1N941B-1, 1N943B-1, 1N944B-1, 1N945B-1, and 1N946B-1, Leaded and Surface Mount Packages, Quality Levels JAN, JANTX, JANTXV, and JANS, Radiation Hardened (Total Dose Only)
04-02-2009
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for 11.70 volts +/-5 percent, silicon, temperature compensated, voltage-reference diodes.
| DevelopmentNote |
Supersedes MIL S 19500/157 (K) (02/2000) T NOTICE 1 - Notice of Validation. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for 11.70 volts ±5 percent, silicon, temperature compensated, voltage-reference diodes. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type as specified in MIL-PRF-19500. Eight levels of radiation hardened assurance (total dose only) are provided for quality levels JANTXV and JANS as specified in MIL-PRF-19500.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Important note : Users cannot be edited or removed once added to your Multi user PDF.