MIL-PRF-19500-169 Revision P:2014
Current
The latest, up-to-date edition.
Semiconductor Device, Diode, Silicon, Switching, Types 1N3070, 1N3070-1, 1N3070UR-1, 1N4938, 1N4938-1, and 1N4938UR-1, Quality Levels JAN, JANTX, JANTXV, JANHC,and JANKC
English
24-12-2014
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for silicon, switching diodes.
| DevelopmentNote |
Supersedes MIL S 19500/169 (H). (02/2000) Inactive for New Design. (04/2008)
|
| DocumentType |
Standard
|
| Pages |
19
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for silicon, switching diodes. Three levels of product assurance (JAN, JANTX, and JANTXV) are provided for each device type and two product assurance levels (JANHC and JANKC) are provided for un-encapsulated die, as specified in MIL-PRF-19500.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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