MIL-PRF-19500-291 Revision W:2016
Current
The latest, up-to-date edition.
Transistor, PNP, Silicon, Switching, Device Types 2N2906A and2N2907A, Encapsulated (Through Holeand Surface Mount Packages)and Unencapsulated, Radiation Hardness Assurance, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, andJANKC
English
17-05-2016
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for PNP, silicon, switching transistors.
| DevelopmentNote |
Supersedes MIL S 19500/291 (E). (02/2000)
|
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for PNP, silicon, switching transistors. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type, and two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device, as specified in MIL-PRF-19500. RHA level designators “E”, “K”, “U”, \"M\", \"D\", \"P\", \"L\", \"R\", \"F\", \"G\" and \"H\" are appended to the device prefix to identify devices, which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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