MIL-PRF-19500-317 Revision T:2015
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Transistor, NPN, Silicon, Switching, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Types 2N2369A, 2N3227, 2N4449, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, JANKC
English
30-08-2015
12-02-2021
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for NPN, silicon, high speed switching transistors (including dual devices).
| DevelopmentNote |
Supersedes MIL S 19500/317 (F). (02/2000)
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| DocumentType |
Standard
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| Pages |
36
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| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Superseded
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| SupersededBy | |
| Supersedes |
This specification covers the performance requirements for NPN, silicon, high speed switching transistors (including dual devices). Four levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance (RHA) to two radiation levels (“R” and “F”) are provided for JANTXV product assurance level. Provisions for RHA to eleven radiation levels are provided for JANS and JANKC. RHA level designators “E”, “K”, “U”, “M”, “D”, “P“, “L”, “R”, “F’, “G”, and “H” are appended to the device prefix to identify devices, which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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