MIL-PRF-19500-343 Revision M:2016
Current
The latest, up-to-date edition.
RF Transistor, NPN, Silicon, Low Power, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Types 2N2857, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
03-11-2016
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for NPN, silicon, low power, ultra-high frequency transistors.
| DevelopmentNote |
Supersedes MIL S 19500/343 (C). (02/2000)
|
| DocumentType |
Standard
|
| Pages |
52
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for NPN, silicon, low power, ultra-high frequency transistors. Four levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each device type. Two levels of product assurance (JANHC and JANKC) are provided for unencapsulated devices as specified in MIL-PRF-19500. RHA level designators “M”, “D”, “P“, “L”, “R”, “F”, “G”, and “H” are appended to the device prefix to identify devices, which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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