MIL-PRF-19500-355 Revision V:2016
Current
The latest, up-to-date edition.
Transistor, Unitized Dual, NPN, Silicon, Types 2N2919, 2N2920, JAN, JANTX, JANTXV, JANS, JANHC and JANKC
16-11-2016
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for two electrically isolated, matched NPN radiation hardened silicon transistors as one dual unit.
| DevelopmentNote |
Supersedes MIL S 19500/355 (D). (02/2000)
|
| DocumentType |
Standard
|
| Pages |
48
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for two electrically isolated, matched NPN radiation hardened silicon transistors as one dual unit. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type, and two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device, as specified in MIL-PRF-19500. Provisions for radiation hardness assurance (RHA) to eleven radiation levels (“E”, “K”, “U”, \"M\", \"D\", \"P\", \"L\", \"R”, “F”, “G” and “H”) are provided for JANTXV, JANS, JANHC, JANKC, JANHCD, and JANKCD product assurance levels.
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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