MIL-PRF-19500-396 Revision M:2015
Current
The latest, up-to-date edition.
Transistor, PNP, Silicon, Switching, Encapsulated (Through Hole and Surface Mount) and Unencapsulated, Radiation Hardness Assurance, Device Types 2N3762, 2N3763, 2N3764, and 2N3765, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC and JANKC, JANHCA, and JANKCA
English
29-05-2015
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for PNP silicon switching transistors.
| DevelopmentNote |
Supersedes MIL S 19500/396 (D). (02/2000)
|
| DocumentType |
Standard
|
| Pages |
44
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for PNP silicon switching transistors. Four
levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each encapsulated device type as specified in MIL-PRF-19500 and two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device type. RHA level designators “M”, “D”, “P“, “L”, “R”, “F’, “G”, and “H” are appended to the device prefix to identify devices, which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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