MIL-PRF-19500-398 Revision L:2015
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Transistor, NPN, Silicon, High-Frequency, Encapsulated (Through-Hole and Surface Mount) and Uncapsulated, Radiation Hardness Assurance, Device Type 2N3866, Quality Levels: JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
11-05-2021
05-06-2015
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1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for NPN silicon 2N3866 transistors for use in VHF-UHF amplifier applications.
| DevelopmentNote |
Supersedes MIL S 19500/398 (04/2006)
|
| DocumentType |
Standard
|
| Pages |
72
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| Supersedes |
This specification covers the performance requirements for NPN silicon 2N3866 transistors for use in VHF-UHF amplifier applications. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS,) are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device type. Provisions for radiation hardness assurance (RHA), eight radiation levels is provided for quality levels JANTXV, JANS, JANHC, and JANKC. RHA level designators “M”, “D”, “P“, “L”, “R”, “F”, “G”, and “H” are appended to the device prefix to identify devices which have passed RHA requirements.
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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