MIL-PRF-19500-441 Revision L:2015
Current
The latest, up-to-date edition.
Transistor, PNP, Silicon, Power, Encapsulated (Through Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N3740 and 2N3741 Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
19-06-2015
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Specifies the performance requirements for power PNP silicon 2N3740 and 2N3741 transistors.
DevelopmentNote |
Supersedes MIL PRF 19500/441 (D). (02/2000)
|
DocumentType |
Standard
|
Pages |
58
|
PublisherName |
US Military Specs/Standards/Handbooks
|
Status |
Current
|
Supersedes |
This specification covers the performance requirements for power PNP silicon 2N3740 and 2N3741 transistors. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type and two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device type as specified in MIL-PRF-19500. Provisions for radiation hardness assurance (RHA) to eight radiation levels is provided for quality levels JANTXV, JANS, JANHC, and JANKC. RHA level designators “M”, “D”, “P”, “L”, “R”, “F”, “G”, and “H” are appended to the device prefix to identify devices, which have passed RHA requirements.
MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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