MIL-PRF-19500-444 Revision P:2017
Current
The latest, up-to-date edition.
Semiconductor Device, Diode, Silicon, Switching, Schottky, Types 1N5711, 1N5712, 1N6857, 1N6858, Through Hole, Surface Mount and Unencapsulated Die, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC
13-04-2017
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for Schottky barrier diodes.
| DevelopmentNote |
Supersedes MIL S 19500/444 (C). (02/2000) Supersedes MIL PRF 19500/445 (D). (03/2006)
|
| DocumentType |
Standard
|
| Pages |
42
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Current
|
| Supersedes |
This specification covers the performance requirements for Schottky barrier diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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