MIL-PRF-19500-452 Revision J:2009
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Semiconductor Device, Diode, Silicon,Voltage-Reference, Temperature Compensated, Types 1N4565A Through 1N4584A,Leaded and Surface Mount Packages and Unencapsulated Die, Quality LevelsJAN, JANTX, JANTXV, JANS, JANHC, and JANKC, Radiation Hardened (Total Dose Only)
04-02-2009
24-04-2021
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
Describes the performance requirements for 6.4 volts +/-5 percent, silicon, low bias current, temperature compensated, voltage-reference diodes.
| DevelopmentNote |
Supersedes MIL S 19500/452 (C) (02/2000) J NOTICE 1 - Notice of Validation. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
44
|
| PublisherName |
US Military Specs/Standards/Handbooks
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| Status |
Superseded
|
| Supersedes |
This specification covers the performance requirements for 6.4 volts ±5 percent, silicon, low bias current, temperature compensated, voltage-reference diodes. Four levels of product assurance (JAN, JANTX, JANTXV, and JANS) are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type die. Seven levels of radiation hardened (total dose only) assurance are provided for quality levels JANTXV, JANS, JANHC and JANKC as specified in MIL-PRF-19500.
| MIL-PRF-19500 Revision P:2010 | Semiconductor Devices, General Specification for |
| MIL-STD-750 Revision F:2011 | Test Methods for Semiconductor Devices |
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